The types of devices being deployed in cars and how they differ in functionality. Why each device type requires a different test technique. Determining the best approach for the specific application.

Over the past several weeks, you’ve probably heard the term “binned” when referring to the chips inside the iPhone 17e and MacBook Neo. But what does it mean? In simple terms, “binning” is the process ...

Testing the performance and power of semiconductors as they come off the production line is beginning to shift left in the fab, reversing a long-standing trend of assessing chips just prior to ...

TOKYO, Dec. 09, 2024 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced an integrated test cell designed to maximize die-level test ...

With data analytics, manufacturers can gain unparalleled insights into their testing processes, identify patterns, predict failures, and optimize operations. From improving yield rates to reducing ...