Measuring the refractive index and the thickness of thin films (films with a thickness from less than a nanometer to several microns) is essential to characterize them and improve the performance of ...

Spectroscopic ellipsometry is widely adopted in semiconductor processing, such as in the manufacturing of integrated circuits, flat display panels, and solar cells. However, a conventional ...

A German–Israeli research team led by Dr. Andreas Furchner has demonstrated how imaging ellipsometry enables non-destructive characterization and quality control of microstructured MXene thin films ...

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New Uvisel Plus includes the next generation of FastAcq technology with increased measurement accuracy. HORIBA Scientific, global leader in spectroscopic ellipsometry for over 25 years, announces the ...

The Film Sense FS-1 Multi-Wavelength Ellipsometer provides fast and reliable thin film measurements using long-life LEDs and a no-moving-parts ellipsometric detector. The film thickness of most ...